1 Historical Survey. - 2 Basic Principles of Electron Optics. - 2. 1. Rotationally Symmetric Lenses in the Bell-Shaped Field Approximation. - 2. 2. Rotationally Symmetric Lenses with Arbitrary Field Distribution. - 2. 3. Aberrations Resulting from Misalignment. - 2. 4. Multipole Fields for Beam Correction. - 2. 5. Image Contrast. - 2. 6. Further Sources of Error. - 2. 7. Fixed Beam and Scanning Mode. - 3 Superconducting Devices in Electron Microscopy. - 3. 1. Advantages of Superconducting Devices. - 3. 2. Technical Problems. - 4 Lens Design and Testing. - 4. 1. Lens Design and Field Distribution. - 4. 2. Correction Systems for Superconducting Objective Lenses. - 4. 3. Testing of Objective Lenses. - 5 Systems with Superconducting Lenses. - 5. 1. Tested Systems. - 5. 2. Projected Systems. - 6 Other Superconducting Elements for Electron Microscopy. - 6. 1. Superconducting High-Voltage Beam Generator. - 6. 2. Magnetic Dipoles. - 7 Proposed Superconducting 3-MV Microscope. - 7. 1. Accelerator. - 7. 2. Spectrometer. - 7. 3. Microscope Column. - 7. 4. Further Improvements of the System. - Appendixes. - A. Superconducting Electron Optical Systems for High-Energy Physics. - A. 1. General Remarks. - A. 2. Magnet Designs. - B. Application of Electron Microscopy to Basic Research on Superconductivity. - B. 1. Imaging by the Decoration Method. - B. 2. Imaging by Electron Shadow Microscopy. - B. 3. Imaging by an Electron Mirror Microscope. - B. 4. Imaging by Lorentz Microscopy. - B. 5. Imaging by a Vortex Electron Microscope. - References. Language: English