This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry. ;Examing every important aspect of the field Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV) the processing of PIV records and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems. ;With over 1500 literature citations tables figures and display equations Speckle Metrology is a resource for students and professionals in the fields of optical mechanical electrical and electronics engineering; applied physics; and stress analysis. Language: English