- Designed to withstand high temperatures, this in-wall power socket supports a current carrying capacity of 10 A, making it ideal for low-power devices. - The socket ensures stable performance through TO3P TO247 5L aging test positions. It features gold plating, providing excellent oxidation resistance for electronic components. - Perfect for mass production lines or electronic repair centers, this aging test and burn-in socket is specifically crafted for efficient testing and validation of TO3P and TO247-5L components. - A reliable solution for electronics engineers, manufacturers, and professionals who need to test and program their semiconductor devices with precision. Key Attributes: - Function: Aging test and burn-in socket for reliable performance. - Compatibility: Specifically designed for TO3P and TO247-5L components. - Material: Gold-plated contacts for enhanced conductivity and longevity. - Performance: Supports 10 A currents, suitable for low-power applications. Use Scenarios: - Utilize in production environments for testing semiconductor reliability during manufacturing. - Implement in repair facilities to assess the functionality of electronic devices before reassembly or resale. - Employ in testing labs for validating the performance of new semiconductor designs before mass production.