- Reliable Performance: Equipped with TO3P TO247 5L aging test sockets, this product features gold plating that enhances antioxidant properties, ensuring the longevity of electronic components. - High Temperature Resistance: Designed to withstand elevated temperatures, the socket supports a current carrying capacity of 10 A, making it ideal for low-power devices. - Enhanced Durability: The user-friendly TO3P TO247 5L aging test sockets improve the longevity and functionality of electronic devices, making them essential tools for any electronics development laboratory. - Versatile Applications: Whether for mass production lines or electronic device repair centers, this aging test and burn-in socket is tailored for efficient testing of TO3P and TO247-5L components. - Key Features: - Function: Supports aging tests for reliable performance. - Compatibility: Specifically designed for TO3P and TO247-5L components. - Material: Gold-plated for superior antioxidant properties. - Size: Compact design suitable for standard electronic setups. - Practical Scenarios: - Ideal for quality assurance in manufacturing environments, ensuring components meet performance standards before deployment. - Useful in repair centers for thorough testing of components, leading to faster turnaround times and improved reliability. This product is the optimal choice for professionals seeking dependable performance and enhanced durability in electronic testing.